Park Min-Seo PMS, Kim Ji-hye KJ hye. End-to-End Quality Control in Additive Manufacturing: Evaluating Defect Detectability, Dimensional Uncertainty, and Qualification Risk Across the Digital Thread. TECHNE J. 2026;1(3):24-36. Accessed March 14, 2026. https://ejournal.kalampractica.com/index.php/techne/article/view/23