PARK MIN-SEO, Park Min-Seo; KIM JI-HYE, Kim Ji-hye. End-to-End Quality Control in Additive Manufacturing: Evaluating Defect Detectability, Dimensional Uncertainty, and Qualification Risk Across the Digital Thread. Techne: Journal of Engineering, Technology and Industrial Applications, [S. l.], v. 1, n. 3, p. 24–36, 2026. Disponível em: https://ejournal.kalampractica.com/index.php/techne/article/view/23. Acesso em: 14 mar. 2026.