Park Min-Seo PM-S, Kim Ji-hye KJ- hye. End-to-End Quality Control in Additive Manufacturing: Evaluating Defect Detectability, Dimensional Uncertainty, and Qualification Risk Across the Digital Thread. TECHNE J [Internet]. 2026 Feb. 13 [cited 2026 Mar. 14];1(3):24-36. Available from: https://ejournal.kalampractica.com/index.php/techne/article/view/23