Published: 03-12-2025

Articles

Data Center Thermal and Energy Efficiency: Modeling Sensor Degradation, Control Latency, and Hotspot Probability During Workload Transitions

Jose Antonio Rivera (Author)

1-11

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Integrated Decision Framework for Railway Signaling and Train Protection: Modeling Latency, Detection Uncertainty, and Capacity-Safety Trade-Offs Under Faults

Nur Atiqah Hamzah, Sokheng Tep (Author)

12-24

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Performance Metrics for Leak Detection and Pressure Control in Urban Water Networks: Assessing Latency, Drift, and Response Efficacy

Randy A. Cruz (Author)

25-35

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Dispatch Reliability in Commercial Aviation Maintenance Operations: Quantifying Delay Risk under Fault Uncertainty, MEL Governance, and Spare-Part Constraints

Lim Wei Jun, Tran Minh Khoa, Ploy S. Rattanakul (Author)

36-45

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Quantifying Defect Escape Risk in Additive Manufacturing: The Impact of Sensor Uncertainty and Control Latency

Nuraini Alwi (Author)

46-52

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Thermal in Cold Chain Logistics: Modeling Time-Above-Threshold Risk under Sensor Uncertainty, Door-Open Events, and Packaging Variability

Siti Farhana Ismail (Author)

53-61

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Engineering for Cosmetic Product Quality and Supply Continuity: Modeling Defect Escape, Batch Release Latency, and Complaint Risk Under Measurement Uncertainty

Sreymao Pech, Ayesha Rahman (Author)

62-69

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E-Commerce Fulfillment Reliability: Quantifying Order Promise Risk Under Inventory Inaccuracy, Pick-Pack Variability, and Carrier Uncertainty

Budi Santosa (Author)

70-82

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Risk-Aware Quality Assurance in Wastewater Treatment: Modeling Effluent Exceedance Probability Under Stochastic Influent and Sensor Decay

Nguyễn Thị Thu Hà (Author)

83-92

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Fintech Transaction Fraud Decision: Quantifying Loss, Friction, and Detection Risk Under Drift, Adversarial Adaptation, and Operational Latency

Sophea Nguon, Sokly Phan, Vuthy Chea (Author)

93-101

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Healthcare Emergency Triage: Quantifying Safety, Throughput, and Equity Risk Under Uncertainty, Crowding, and Decision Latency

Sreyneang Keo (Author)

102-112

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Semiconductor Wafer Fab Yield: Quantifying Defect Escape, Metrology Uncertainty, and Time-to-Containment Under Process Drift and Inspection Capacity Constraints

Lê Thị Hồng Nhung (Author)

114-121

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